General Papers
| The Description of Shape Development of 2 Dimensional (Semi)-Elliptic Surface Defects Using a Maximum Compliance Increase Hypothesis for Defect Growth | |
| H. C. van Elst, J. W. Tichler |
| The Geometry Dependence and Significance of Maximum Load Toughness Values | |
| O. L. Towers, S. J. Garwood |
| Use of the R-Curve for Design with Contained Yield | |
| C. E. Turner |