The Description of Shape Development of 2 Dimensional (Semi)-Elliptic Surface Defects Using a Maximum Compliance Increase Hypothesis for Defect Growth

H. C. van Elst; J. W. Tichler

Digital Repository, ECF3, London 1980

H. C. van Elst, J. W. Tichler

Last modified: 2012-10-16

Abstract

Full Text: PDF