Digital Repository, ICF10, Honolulu (USA) 2001
Home
About
Log In
Account
Search
Archive
Home
>
International Conference on Fracture
>
ICF10, Honolulu (USA) 2001
>
General Papers
>
Yonezu
Font Size:
Fatigue strength and fracture mechanism of silicon nitrides studied by AE waveform simulation
A. Yonezu, T. Ogawa, M. Takemoto
Last modified: 2013-04-03
Abstract
---
Full Text:
PDF